Maker:Panalytical/Model:Aeris /Year of Introduction:2024/Examine crystal structure of specimen by diffraction of X-rays. The wavelengths is 0.1 to 10 nm and intensity depends on scattering direction.
XRD
![](https://bme.t.u-tokyo.ac.jp/wp-content/uploads/2024/08/DSCN0230-725x500.jpg)
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